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- Akino, T (1) Apply Akino, T filter
- Dornisch, MF. (2) Apply Dornisch, MF. filter
- Finér, L (2) Apply Finér, L filter
- Jurgensen, S (2) Apply Jurgensen, S filter
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- Niemelä, P (1) Apply Niemelä, P filter
- Ohashi, P (1) Apply Ohashi, P filter
- Punttila, P (3) Apply Punttila, P filter
- Savolainen, R (1) Apply Savolainen, R filter
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- Journal of Applied Entomology (2) Apply Journal of Applied Entomology filter
- XXIII International Congress of Entomology, Abstracts, 6 - 12 July, 2008: International Convention Centre, Durban, South Africa (1) Apply XXIII International Congress of Entomology, Abstracts, 6 - 12 July, 2008: International Convention Centre, Durban, South Africa filter